ESD/EFT/서지
EMI Receiver
ESD/TLP
절연/부품시험
RF파워/Pre Amp
RF/EMC시스템
MONITORING
전자파측정기
Antenna
EMC-PROBE
EMC-CDN
노이즈발생기
Mast/Tripod
FLUKE
드론감지시스템
RF&ACCESSORY
데모장비판매
기타(etc)
 
 
 

 WhatIsTLP? (1) TLP Generator (7) CMTI Generator (1) Accessory (3)
Total 7
80A High Current TLP/HMM Test System TLP-8010A
  • Wafer, package and system level TLP/HMM testing
  • Fast 50 Ω high voltage pulse output with typically 300 ps rise time
  • Up to 90 kW peak output power into 50 Ω load
  • Built-in HMM pulse up to ±16 kV with 100 Ω configuration
  • High pulse output current up to ±80 A (short circuit) with 6 dB reflection suppression
  • 6 GPIB programmable pulse rise times: 300 ps to 50 ns
  • 1 built-in pulse width: 2 ns plus 100 ns with one external charge line cable
  • Optional external pulse width extensions from 2 ns to 500 ns using the pulse width extender TLP-8012A5
  • Fast measurement time, typically 0.5 s per pulse including one-point DC measurement between pulses
  • Reverse recovery measurement capabilities in the range of ns up to µs
  • High-Voltage DMOS SOA measurements
  • Efficient MATLAB?-based software for system control and waveform data management
  • The software can control automatic probers for fast measurements of complete wafers
  • High performance and high quality components


    • Pulse Width Extender TLP-8012A5
    Features of the System

    • Pulse width extender for the 80A high current TLP/HMM
      test system TLP-8010A

    • 6 manual selectable pulse width: 5, 10, 50, 100,
      200 and 500ns


    80A High Current TLP/VF-TLP/HMM Test System TLP-8010C
  • Wafer, package and system level TLP/VF-TLP/HMM testing
  • Combines TLP-8010A and TLP-3010C into one system
  • Can be operated together with TLP-8012A5 and TLP-3011C
       pulse width extenders
  • Ultra fast 50 Ω high voltage pulse output with typical rise time
       100 ps (0-30 A) and 300 ps (> 30 A)
  • Up to 90 kW peak output power into 50 Ω load
  • Built-in HMM pulse up to ±16 kV with 100 Ω configuration
  • High pulse output current up to ±80 A (short circuit) with
       6 dB reflection suppression
  • High speed 50 Ω trigger output for oscilloscopes
       (synchronous to high voltage pulse output)
  • 6 GPIB programmable pulse rise times: 100 ps to 50 ns
  • 8 programmable pulse widths: 1 ns to 100 ns (0-30 A),
       1 built-in pulse width: 2 ns (> 30 A)
  • The optional pulse width extender TLP-3011C enables pulse
        width up to 1.6 µs in 68 GPIB programmable steps (0-30 A)
  • Optional external pulse width extensions from 2 ns to 500 ns
       (> 30 A) using the external pulse width extender TLP-8012A5
  • Fast measurement time, typically 0.5 s per pulse including one-point
       DC measurement between pulses
  • Reverse recovery measurement capabilities in the range of ns up to µs
  • High-Voltage DMOS SOA measurements
  • Efficient MATLAB?-based software for system control and waveform data management
  • The software can control automatic probers for fast measurements of complete wafers
  • High performance and high quality components


    • 30A TLP/VF-TLP/HMM Test System TLP-3010C/3011C
    Pulse System TLP-3010C/3011C for the following applications fields:

    • ESD robustness characterization on wafer-, chip- and board-level by TLP/vf-TLP/HMM pulse types
    • Safe-Operating-Area (SOA) measurements of active and passive devices from 1 ns to 1.6 µs pulse width
    • Reverse and forward recovery measurements of diodes from 200 ps to 1 µs
    • Breakdown and turn on/off characteristics of devices
    • Measurement of the impulse response

    Features of the System

    • Wafer and system level TLP/VF-TLP/HMM test system
    • Ultra fast 50 Ω pulse output with 100 ps rise time
    • Built-in HMM (IEC 61000-4-2) pulse up to ±8 kV
    • High pulse output current up to ±30 A
    • 6 programmable pulse rise-times: 100 ps to 45 ns
    • 8 programmable pulse widths: 1 ns to 100 ns
    • Optional pulse width extender increases pulse width up to 1.6 µs in 68 GPIB programmable steps
    • Fast measurement time, typically 0.5 s per pulse including one-point DC measurement between pulses
    • Efficient MATLAB?-based software for system control and waveform data management


    AutomatedTestSystem ATS-8000A
    The ATS-8000A test system is a fully automated 2-pin probing solution for HBM, TLP ,HMM and CC-TLP on package-and waferlevel. Future extension for CDM is optional.
    The vacuum rotary stage can be configured for any package shape, any package size and wafers.
    The probe force sensors ensures maximum probe tip life time and avoid job interruption.
    The 3-axis motion systems and rotary stage are designed for ultra-fast speed to maximize throughput.
    The user interface and data management is based on HPPI standard software.
    Easy to use, rugged high quality components, high throughput.
    TLP-12010C

    TLP-12010C

    120 A High Voltage 50 Ω Pulse Generator

    Features

    • High pulse output current up to 120 A (short circuit)
    • Ultra-fast 50 Ω high voltage pulse output with typical rise time 100 ps (0 A to 40 A) and 300 ps in high-current mode (0 A to 120 A)
    • Wafer, package and system level TLP, VF-TLP and HMM testing
    • Up to 180 kW peak output power into 50 Ω load
    • Built-in HMM pulse up to ±32 kV in 50 Ω-configuration
    • High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)
    • 6 USB programmable pulse rise times: 100 ps to 50 ns (custom selectable)
    • 8 (optional 9) programmable pulse widths: 0.5 ns (optional), 1 ns to 100 ns (0 A to 40 A), 1 built-in pulse width: 100 ns (>40 A)
    • The optional pulse width extender TLP-3011C enables pulse width up to 1.6 µs in 68 GPIB programmable steps (0 A to 40 A)
    • Optional external pulse width extensions from 5 ns to 500 ns (>40 A to 120 A)using the external pulse width extender TLP-12012A6
    • Built-in pulse reflection suppression
    • Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses
    • Efficient sofware for system control and waveform data management
    • The sofware can control automatic probers for fast measurements of complete wafers
    • Combines TLP-12010A and TLP-4010C into one system
    • Can be operated together with TLP-12012A6 and TLP-3011C pulse width extenders
    • Integrated interlock safety shut-down
    • Industrial isolated and EMI/ESD protected USB control interface
    TLP-12010A

    TLP-12010A

    High Voltage 50 Ω Pulse Generator

    Features

    • High pulse output current up to ±120 A (short circuit)
    • Ultra-fast 50 Ω high voltage pulse output with typical 300 ps rise time
    • Wafer, package and system level TLP and HMM testing
    • 180 kW peak output power into 50 Ω load
    • Built-in HMM pulse up to ±32 kV in 50 Ω-configuration
    • High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)
    • 6 digital programmable pulse rise times out of: 300 ps to 50 ns (optional)
    • 1 built-in pulse width: 100 ns
    • Optional external pulse width extensions from 5 ns to 500 ns using the external pulse width extender TLP-12012A6
    • Built-in pulse reflection suppression
    • Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses
    • Efficient software for system control and waveform data management
    • The software can control automatic probers for fast measurements of complete wafers
    • Integrated interlock safety shut-down
    • Industrial isolated and EMI/ESD protected USB control interface
    and or